Basket Items; 0
Total: 0
Left until free delivery: 300
Proceed to basket

External HDD drives (222)

[Sandėlyje]
Brand
Price
[Nuo:] € [Iki:] €
Talpa

Kietasis diskas SILICON POWER 1TB, PORTABLE HARD DRIVE ARMOR A30, USB 3.0, BLACK

  • Measurements: 87.5 x 134 x 18.6 mm
  • Compatibility: Windows
  • Specialios funkcijos: - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 - Meet the U.S. military drop-test standards MIL-STD 810G Method 516.6 Procedure IV (transit drop test), including specific height / - SuperSpeed USB 3.0 compliant and backwards compatible with USB 2.0 -
  • Design: Portable
66.99 €

© 2006-2018 All rights reserved. Fotoaparatas.lt